From pixels to patterns: high-throughput image classification and morphometry through a new PI-10 imaging pipeline
Mortelmans, J.; Decrop, W.; Heynderickx, H.; Cattrijsse, A.; Depaepe, M.; van Walraven, L.; Scott, J.D.; van Oevelen, D.; Deneudt, K.; Muñiz, C. (2025). From pixels to patterns: high-throughput image classification and morphometry through a new PI-10 imaging pipeline, in: Praet, N. et al. Particles in Europe 2025: Conference program and proceedings, 17 - 19 September 2025, Ostend, Belgium. pp. 54-60
In: Praet, N.; Plancke, Y. (Ed.) (2025). Particles in Europe 2025: Conference program and proceedings, 17 - 19 September 2025, Ostend, Belgium. Flanders Marine Institute/Flanders Hydraulics/Institute of Natural Sciences/Sequoia Scientific Inc.: Ostend. XIX, 246 pp. https://dx.doi.org/10.48607/346, more
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Document type: Conference paper
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- Mortelmans, J., more
- Decrop, W., more
- Heynderickx, H., more
- Cattrijsse, A., more
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- Depaepe, M.
- van Walraven, L., more
- Scott, J.D.
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