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Leermakers, M.; Gao, Y.; Navez, J.; Poffijn, A.; Croes, K.; Baeyens, W. (2009). Radium analysis by sector field ICP-MS in combination with the Diffusive Gradients in Thin Films (DGT) technique. J. Anal. At. Spectrom. 24(8): 1115-1117. https://dx.doi.org/10.1039/B821472G, more
Leermakers, M.; Gao, Y.; Navez, J.; Poffijn, A.; Croes, K.; Baeyens, W. (2009). Radium analysis by sector field ICP-MS in combination with the Diffusive Gradients in Thin Films (DGT) technique. J. Anal. At. Spectrom. 24(8): 1115-1117.